Device characterization
We perform dark and illuminated I-V measurements under carefully controlled conditions, including spectrum, intensity, and temperature. Additionally, we can conduct external quantum efficiency measurements and capacitance-voltage measurements to ensure precise and reliable data.
Film characterization (optical, electrical and structural)
Our film characterization capabilities include a variety of optical, electrical, and structural analysis tools. These include spectroscopic ellipsometry, reflection-transmission measurements, Raman spectroscopy, FTIR, current-voltage, capacitance-voltage, and 4-point probe measurements. We also utilize X-ray diffraction analysis and a wide range of microscopy techniques, such as confocal microscopy, SEM, and TEM.
Laser patterning
Our picosecond laser enables selective layer removal and patterning, achieving feature sizes down to 20 μm. This precision allows for the creation of intricate and detailed patterns on various layers.