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Structural differences between Sb- and Nb-doped tin oxides and consequences for electrical conductivity
Sb- and Nb-doped tin oxides have been prepared by a co-precipitation method. Whilst X-ray powder diffraction and EDX mapping indicate similar dopant distributions, more detailed characterisation by variable high-temperature XRD, Sn-119 MAS NMR and Nb K-edge X-ray absorption near edge structure spectroscopy reveal clear differences in the oxide structures. This detailed structural information is used to validate the measured differences in electrical conductivity.

Authors: E. Oakton, J. Tillier, G. Siddiqi, Z. Mickovic, O. Sereda, A. Fedorov, et al.

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